Optical constants of Si-Ge (Silicon-germanium, SiGe)
Jellison et al. 1993: 98% Si, Si substrate; n,k 0.24–0.84 µm
Wavelength:
µm
(0.240–0.840)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_is_absolute: true wavelength_is_vacuum: false x: 0.98 thickness: 8 μm substrate: Si
Comments
SixGe1-x, x = 0.98. 8-μm film grown on Si substrate.
References
G. E. Jellison Jr., T. E. Haynes, H. H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry, Opt. Mat. 2, 105-117 (1993)