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Optical constants of Si-Ge (Silicon-germanium, SiGe)
Jellison et al. 1993: 98% Si, Si substrate; n,k 0.24-0.84 µm

Wavelength: µm
 (0.240 – 0.840)  
 

Derived optical constants

n   k   logX   logY   eV

Conditions & Spec sheet

n_is_absolute: true
λ_is_vacuum: false
x: 0.98
thickness: 8 μm
substrate: Si

Comments

SixGe1-x, x = 0.98. 8-μm film grown on Si substrate.

References

G. E. Jellison Jr., T. E. Haynes, H. H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry, Opt. Mat. 2, 105-117 (1993)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Silicon-germanium, SiGe

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