Optical constants of Si-Ge (Silicon-germanium, SiGe)
Jellison et al. 1993: 65% Si, Si substrate; n,k 0.24–0.84 µm
Wavelength:
µm
(0.240–0.840)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions
x: 0.65 thickness: 8 μm substrate: Si
Comments
SixGe1-x, x = 0.65. 8-μm film grown on Si substrate.
References
G. E. Jellison Jr., T. E. Haynes, H. H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry. Opt. Mat. 2, 105-117 (1993)