RefractiveIndex.INFO

Refractive index database


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Optical constants of Si-Ge (Silicon-germanium, SiGe)
Jellison et al. 1993: 20% Si, Ge substrate; n,k 0.24-0.84 µm

Wavelength: µm
 (0.240 – 0.840)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: false
x: 0.20
thickness: 8 μm
substrate: Ge

Comments

SixGe1-x, x = 0.20. 8-μm film grown on Ge substrate.

References

G. E. Jellison Jr., T. E. Haynes, H. H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry, Opt. Mat. 2, 105-117 (1993)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Silicon-germanium, SiGe

External links