Optical constants of In2O3-SnO2 (Indium tin oxide, ITO)
Minenkov et al. 2024: on Si wafer, top; n,k 0.191–1.69 µm
Wavelength:
µm
(0.19146–1.68869)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions
film_thickness: 8.8E-8 substrate: SiO2/Si
Comments
88 nm thick sputter-coated, graded ITO layer on a SiO2-Si wafer. Top part of the layer.
References
A. Minenkov, S. Hollweger, J. Duchoslav, O. Erdene-Ochir, M. Weise, E. Ermilova, A. Hertwig, M. Schiek. Monitoring the electrochemical failure of indium tin oxide electrodes via operando ellipsometry. ACS Appl Mater Interfaces 16, 9517-9531 (2024) (Numerical data kindly provided by Manuela Schiek)
Data
Additional information
About Indium tin oxide
Other names and variations:
- ITO
- In2O3-SnO2
- Tin-doped indium oxide