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Optical constants of In2O3-SnO2 (Indium tin oxide, ITO)
Minenkov et al. 2024: on Si wafer, bottom; n,k 0.191–1.69 µm

Wavelength: µm
 (0.19146–1.68869)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_is_absolute: true
wavelength_is_vacuum: true
film_thickness: 88e-9
substrate: SiO2/Si

Comments

88 nm thick sputter-coated, graded ITO layer on a SiO2-Si wafer. Bottom part of the layer.

References

A. Minenkov, S. Hollweger, J. Duchoslav, O. Erdene-Ochir, M. Weise, E. Ermilova, A. Hertwig, M. Schiek. Monitoring the electrochemical failure of indium tin oxide electrodes via operando ellipsometry, ACS Appl Mater Interfaces 16, 9517-9531 (2024) (Numerical data kindly provided by Manuela Schiek)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Indium tin oxide (ITO), In2O3-SnO2

Other names

  • Tin-doped indium oxide

External links