Optical constants of In2O3-SnO2 (Indium tin oxide, ITO)
Minenkov et al. 2024: on Si wafer, bottom; n,k 0.191–1.69 µm
Wavelength:
µm
(0.19146–1.68869)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_is_absolute: true wavelength_is_vacuum: true film_thickness: 88e-9 substrate: SiO2/Si
Comments
88 nm thick sputter-coated, graded ITO layer on a SiO2-Si wafer. Bottom part of the layer.
References
A. Minenkov, S. Hollweger, J. Duchoslav, O. Erdene-Ochir, M. Weise, E. Ermilova, A. Hertwig, M. Schiek. Monitoring the electrochemical failure of indium tin oxide electrodes via operando ellipsometry, ACS Appl Mater Interfaces 16, 9517-9531 (2024) (Numerical data kindly provided by Manuela Schiek)
Data
INFO
Indium tin oxide (ITO), In2O3-SnO2
Other names
- Tin-doped indium oxide