Optical constants of WS2 (Tungsten disulfide)
Ermolaev et al. 2020: monolayer film; n,k 0.365–1.70 µm
Complex refractive index (n+ik)
Derived optical constants
Conditions & Spec sheet
n_absolute: true wavelength_vacuum: true film_thickness: 1L substrate: SiO2/Si
Optical constants of monolayer WS2 were measured by spectroscopic ellipsometry in the spectral range 365‑1700 nm. WS2 samples were grown on sapphire by atmospheric pressure chemical vapor deposition and then transferred on silicon wafers covered by 295 nm SiO2. Tauc–Lorentz oscillators were used in ellipsometry model to describe the optical response of excitons.
G. A. Ermolaev, D. I. Yakubovsky, Yu. V. Stebunov, A. V. Arsenin, V. S. Volkov. Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersion, J. Vac. Sci. Technol. B 38, 014002 (2020) (Numerical data kindly provided by Georgy Ermolaev)