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Optical constants of TiO2 (Titanium dioxide)
Kischkat et al. 2012: Thin film; n,k 1.54-14.29 µm

Wavelength: µm
 (1.53846 – 14.28571)  
 

Derived optical constants

n   k   logX   logY   eV

Comments

352-nm single layer on Si substrate. Prepared by room temperature reactive sputter deposition using TiO2 target.
Data on the influence of deposition conditions on the optical properties of the film can be found in the original publication.
Data on the refractive index (n) in the visible can be found in the original publication.

References

J. Kischkat, S. Peters, B. Gruska, M. Semtsiv, M. Chashnikova, M. Klinkmüller, O. Fedosenko, S. Machulik, A. Aleksandrova, G. Monastyrskyi, Y. Flores, and W. T. Masselink. Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride, Appl. Opt. 51, 6789-6798 (2012) (Numerical data kindly provided by Jan Kischkat)

Data

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INFO

Titanium dioxide, TiO2

Other names

  • Titanium(IV) oxide
  • Titania

Mineral

  • Rutile

External links