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Optical constants of TiN (Titanium nitride)
Shkondin et al. 2017: Annealed at 900 °C; n,k 0.211–1.69 µm

Wavelength: µm
 (0.21073 – 1.68888)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: true
film_thickness: 105 nm
substrate: Si
annealing_temperature: 900 °C

Comments

105 nm thick titanium nitride (TiN) film on Si substrate annealed at 900 °C.

References

E. Shkondin, T. Repän, O. Takayama, and A. V. Lavrinenko. High aspect ratio titanium nitride trench structures as plasmonic biosensor, Opt. Mater. Express 7, 4171-4182 (2017) (Numerical data kindly provided by Osamu Takayama)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Titanium nitride, TiN

Other names

  • Tinite
  • TiNite

External links