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Optical constants of Te (Tellurium)
Ciesielski et al. 2018: 30-nm film; n,k 0.2-2 µm

Wavelength: µm
 (0.20000 – 2.0000)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: true
film_thickness: 30 nm
substrate: SiO2

Comments

30 nm-thick tellurium film deposited directly on SiO2 substrate

References

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver, Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Tellurium, Te

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