Optical constants of Te (Tellurium)
Ciesielski et al. 2018: 30-nm film; n,k 0.2–2 µm
Wavelength:
µm
(0.20000–2.0000)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_is_absolute: true wavelength_is_vacuum: true film_thickness: 30e-9 substrate: SiO2
Comments
30 nm-thick tellurium film deposited directly on SiO2 substrate
References
A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver, Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)