RefractiveIndex.INFO

Refractive index database


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Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Rodríguez-de Marcos et al. 2016: Thin film; n,k 0.03-1.5 µm

Wavelength: µm
 (2.99714E-02 – 1.51066E+00)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: true
deposition_temperature: 300 °C

Comments

Oxide films were deposited by reactive electron-beam evaporation onto various sorts of substrates at 300 °C

References

L. V. Rodríguez-de Marcos, J. I. Larruquert, J. A. Méndez, J. A. Aznárez. Self-consistent optical constants of SiO2 and Ta2O5 films, Opt. Mater. Express 6, 3622-3637 (2016) (Numerical data kindly provided by Juan Larruquert)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Silicon dioxide, SiO2

Other names

  • Quartz
  • Silica
  • Silicon oxide
  • Silicon(IV) dioxide

Polymorphs

  • Alpha quartz (α-quartz, most common)
  • Beta quartz (β-quartz, only stable at temperatures above 573 °C)
  • Tridymite
  • Cristobalite
  • Coesite
  • Stishovite
  • Lechatelierite
  • Chalcedony

External links