Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Rodríguez-de Marcos et al. 2016: Thin film; n,k 0.03–1.5 µm
Wavelength:
µm
(2.99714E-02 – 1.51066E+00)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_absolute: true wavelength_vacuum: true deposition_temperature: 300 °C
Comments
Oxide films were deposited by reactive electron-beam evaporation onto various sorts of substrates at 300 °C
References
L. V. Rodríguez-de Marcos, J. I. Larruquert, J. A. Méndez, J. A. Aznárez. Self-consistent optical constants of SiO2 and Ta2O5 films, Opt. Mater. Express 6, 3622-3637 (2016) (Numerical data kindly provided by Juan Larruquert)
Data
INFO
Silicon dioxide, SiO2
Other names
- Quartz
- Silica
- Silicon oxide
- Silicon(IV) dioxide
Polymorphs
- Alpha quartz (α-quartz, most common)
- Beta quartz (β-quartz, only stable at temperatures above 573 °C)
- Tridymite
- Cristobalite
- Coesite
- Stishovite
- Lechatelierite
- Chalcedony