Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Lemarchand 2013: Thin film; n,k 0.25–2.5 µm
Wavelength:
µm
(0.250–2.500)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Comments
580-nm monolayer deposited on BK7 substrate using the magnetron sputtering technique.
References
F. Lemarchand, private communications (2013). Measurement method described in:
L. Gao, F. Lemarchand, and M. Lequime. Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering, Opt. Express 20, 15734-15751 (2012)
Data
INFO
Silicon dioxide, SiO2
Other names
- Quartz
- Silica
- Silicon oxide
- Silicon(IV) dioxide
Polymorphs
- Alpha quartz (α-quartz, most common)
- Beta quartz (β-quartz, only stable at temperatures above 573 °C)
- Tridymite
- Cristobalite
- Coesite
- Stishovite
- Lechatelierite
- Chalcedony