RefractiveIndex.INFO

Refractive index database


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Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Lemarchand 2013: Thin film; n,k 0.25-2.5 µm

Wavelength: µm
 (0.250 – 2.500)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Comments

580-nm monolayer deposited on BK7 substrate using the magnetron sputtering technique.

References

F. Lemarchand, private communications (2013). Measurement method described in:
L. Gao, F. Lemarchand, and M. Lequime. Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering, Opt. Express 20, 15734-15751 (2012)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Silicon dioxide, SiO2

Other names

  • Quartz
  • Silica
  • Silicon oxide
  • Silicon(IV) dioxide

Polymorphs

  • Alpha quartz (α-quartz, most common)
  • Beta quartz (β-quartz, only stable at temperatures above 573 °C)
  • Tridymite
  • Cristobalite
  • Coesite
  • Stishovite
  • Lechatelierite
  • Chalcedony

External links