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Optical constants of Si3N4, SiN (Silicon nitride)
Vogt 2015: Non-stoichiometric SiN #1; n,k 0.25-1.7 µm

Wavelength: µm
 (0.25–1.7)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

film_thickness: 105e-9
substrate: Si

Comments

105 nm thick silicon-nitride (SiN) film on a polished Si wafer. n = 1.91 @ 633 nm. Room temperature.

References

M. R. Vogt. Development of physical models for the simulation of optical properties of solar cell modules, PhD. Thesis (2015)

Data

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INFO

Silicon nitride, Si3N4

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