RefractiveIndex.INFO

Refractive index database


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Optical constants of MoS2 (Molybdenum disulfide)
Yim et al. 2014: 3-nm film; n,k 0.38-0.90 µm

Wavelength: µm
 (0.382127 – 0.888102)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: true
film_thickness: 3.01 nm
substrate: SiO2/Si

Comments

3.01 nm film synthesized by vapor phase sulfurization. ~290 nm thick SiO2 substrate thermally grown on <100> oriented crystalline Si wafer.

References

C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney and G. S. Duesberg. Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry, Appl. Phys. Let. 104, 103114 (2014)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Molybdenum disulfide, MoS2

External links