Optical constants of MoS2 (Molybdenum disulfide)
Yim et al. 2014: 20-nm film; n,k 0.38–0.90 µm
Wavelength:
µm
(0.381514–0.889147)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_is_absolute: true wavelength_is_vacuum: true film_thickness: 19.88e-9 substrate: SiO2/Si
Comments
19.88 nm film synthesized by vapor phase sulfurization. ~290 nm thick SiO2 substrate thermally grown on <100> oriented crystalline Si wafer.
References
C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney and G. S. Duesberg. Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry, Appl. Phys. Let. 104, 103114 (2014)