RefractiveIndex.INFO

Refractive index database

Shelf

Book

Page

Optical constants of Ge (Germanium)
Ciesielski et al. 2018: 20-nm film; n,k 0.2-2 µm

Wavelength: µm
 (0.20000 – 2.0000)  
 

Derived optical constants

n   k   logX   logY   eV

Conditions & Spec sheet

n_is_absolute: true
λ_is_vacuum: true
film_thickness: 20 nm
substrate: SiO2

Comments

20 nm-thick germanium film deposited directly on SiO2 substrate

References

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver, Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Germanium, Ge

External links