Optical constants of Ge (Germanium)
Amotchkina et al, 2020: 0.42 µm film; n,k 0.4–15 µm
Wavelength:
µm
(0.400–15.00)
Complex refractive index (n+ik)
n
k
LogX
LogY
eV
Derived optical constants
Conditions & Spec sheet
n_is_absolute: false wavelength_is_vacuum: false substrate: ZnSe film_thickness: 0.42e-6
Comments
0.42 µm Ge3 film deposited on 1 mm thick ZnSe substratee by e-beam evaporation at 120 °C substrate temperature.
References
T. Amotchkina, M. Trubetskov, D. Hahner, V. Pervak, Characterization of e-beam evaporated Ge, YbF3, ZnS, and LaF3 thin films for laser-oriented coatings, Appl. Opt. 59, A40-A47 (2020) (Data kindly provided by Tatiana Amotchkina [data] [description])