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Optical constants of EuS (Europium sulfide)
Meretska et al. 2022: thin film; n,k 0.190–1.700 µm

Wavelength: µm
 (0.190 – 1.7000)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions & Spec sheet

n_absolute: true
wavelength_vacuum: true
film_thickness: 100 nm
substrate: Si

Comments

Ellipsometry sample: 100 nm thin film of electron beam evaporated EuS deposited on a 0.5 mm thick Si substrate held at room temperature. The base vacuum of the system was ~6×10-8 Torr whereas during electron-beam evaporation of EuS it was at ~2×10-6 Torr.

References

M. L. Meretska, F. H. B. Somhorst, M. Ossiander, Y. Hou, J. Moodera, F. Capasso. Measurements of the magneto-optical properties of thin-film EuS at room temperature in the visible spectrum, Appl. Phys. Lett. 120, 251103 (2022) (Numerical data kindly provided by Frank Somhorst)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

INFO

Europium sulfide, EuS

Other name

  • Europium(II) sulfide
  • Europium sulphide
  • Europium(II) sulphide

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