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Optical constants of HfO2 (Hafnium dioxide, Hafnia)
Siefke et al. 2026: Thin film; n,k 0.124–0.620 µm

Wavelength: µm
 (0.1239842–0.6199210)  
 

Complex refractive index (n+ik)[ i ]


n   k   LogX   LogY   eV

Derived optical constants

Conditions

film_thickness: 2.2E-7
substrate: SiO2

Comments

HfO2 thin films deposited by plasma-enhanced atomic layer deposition (PEALD)

References

T. Siefke, K. Gerold, S. Shestaeva, P. Paul, S. Alam, D. Franta, A. Szeghalmi, S. Schröder, S. Kroker. Atomic layer deposition for hafnium oxide-based meta-optics in the ultraviolet spectral range. J. Eur. Opt. Society-Rapid Publ. 22, 33 (2026) (Numerical data kindly provided by Thomas Siefke)

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

Additional information

About Hafnium dioxide

Hafnium dioxide (HfO2) is a high-index, low-absorption material used extensively in optical applications. It is especially valuable for making thin-film dielectric coatings for mirrors, anti-reflective coatings, and beam splitters. Due to its excellent thermal stability and resistance to chemical corrosion, it is well-suited for harsh environments. Additionally, its high refractive index makes it an attractive material for planar waveguides and other integrated optics components. Beyond its optical uses, hafnium dioxide is also a key material in the fabrication of advanced gate dielectrics in field-effect transistors, contributing to the miniaturization and performance improvement of electronic devices.

Other names and variations:
  • HfO2
  • Hafnia
  • Hafnium(IV) oxide
  • Hafnium oxide
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