Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Franta et al. 2016: n,k 0.0248–125 µm
Complex refractive index (n+ik)
Derived optical constants
Comments
Fused silica SiO2 plate; Thickness 0.405 mm; Heterogenous data processing combining ellipsometric and spectrophotometric measurements with tabulated refractive index data (SCHOTT Lithosil Q2 product sheet) and Palik's tabulated data in EUV (only the spectral distribution of the imaginary part of the susceptibility and not the absolute value was fitted); Room temperature.
References
D. Franta, D. Nečas, I. Ohlídal. A. Giglia. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. Proc. SPIE 9890, 989014 (2016) (Numerical data kindly provided by Daniel Franta)
Data
Additional information
About Silicon dioxide
Silicon dioxide (SiO2), commonly known as silica, is found naturally in several crystalline forms, the most notable being quartz. Additionally, when silicon dioxide is manufactured without the crystalline structure, it forms what is known as fused silica. Fused silica is a non-crystalline (or amorphous) form of silicon dioxide and is produced by melting high purity silica at extremely high temperatures. It has superior optical clarity, especially in the ultraviolet (UV) range, and is resistant to thermal shock, making it valuable for many high-end optical applications, including lenses and windows in spacecraft and satellites. SiO2 is extensively used in electronics as an insulator and serves as a primary ingredient in the production of glass. It's also used in thin-film optics, often as antireflection coatings on optical devices. Beyond its optical applications, silicon dioxide finds use in ceramics, construction, and even as a food additive. Polymorphs:
- Alpha quartz (α-quartz, most common)
- Beta quartz (β-quartz, only stable at temperatures above 573 °C)
- Tridymite
- Cristobalite
- Coesite
- Stishovite
- Lechatelierite
- Chalcedony
- SiO2
- Quartz
- Silica
- Silicon oxide
- Silicon(IV) dioxide