Optical constants of MoS2 (Molybdenum disulfide)
Ermolaev et al. 2020: monolayer film; n,k 0.365-1.70 µm
Complex refractive index (n+ik)
Derived optical constants
Conditions & Spec sheet
n_absolute: true wavelength_vacuum: true film_thickness: 1L substrate: SiO2/Si
Optical constants of monolayer MoS2 were measured by spectroscopic ellipsometry in the spectral range 365‑1700 nm. MoS2 samples were synthesized by atmospheric pressure chemical vapor deposition on silicon wafers with 285 nm of SiO2. Tauc–Lorentz oscillators were used in ellipsometry model to describe the optical response of excitons.
G. A. Ermolaev, D. I. Yakubovsky, Yu. V. Stebunov, A. V. Arsenin, V. S. Volkov. Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersion, J. Vac. Sci. Technol. B 38, 014002 (2020) (Numerical data kindly provided by Georgy Ermolaev)