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Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Lemarchand 2013: Thin film; n,k 0.25-2.5 µm

Wavelength: µm
 (0.250 – 2.500)  
 

Other optical constants

n   k   logX   logY   eV

Comments

580-nm monolayer deposited on BK7 substrate using the magnetron sputtering technique.

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

References

F. Lemarchand, private communications (2013). Measurement method described in:
L. Gao, F. Lemarchand, and M. Lequime. Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering, Opt. Express 20, 15734-15751 (2012)

More info - wiki

Silicon dioxide, SiO2

Other names

Polymorphs

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