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Optical constants of SiO2 (Silicon dioxide, Silica, Quartz)
Gao et al. 2013: Thin film; n,k 0.252-1.250 µm

Wavelength: µm
 (0.252 – 1.250)  
 

Other optical constants

n   k   logX   logY   eV

Comments

300-nm monolayer deposited on fused silica using the ion assistance electronic beam deposition technique.

Data

[CSV - comma separated]   [TXT - tab separated]   [Full database record]

References

L. Gao, F. Lemarchand, M. Lequime. Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs, J. Europ. Opt. Soc. Rap. Public. 8, 13010 (2013) (Numerical data kindly provided by F. Lemarchand)

More info - wiki

Silicon dioxide, SiO2

Other names

Polymorphs

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